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Location: Home-Products
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  • Probe Station
  • Two-Dimensional Materials Transfer Platform
  • accessory
  • RF Probe
  • Test instrument
  • Vibration Free Table
  • 微光显微镜
  • Laser
  • Optical measuring instrument
  • Gas discharge and plasma diagnostic instrument
PCB probe station

PCB probe station

Realize impedance of PCB products DELAY、 Testing of S-parameters such as delay difference, insertion loss, and return loss Applicable industries: TFT-LCD industry, STN-LCD industry, OLED industry, se

High voltage fixture

High voltage fixture

CINDBEST High voltage fixture Available in 3kv, 5kv, and 10kv options Line length 1.8m The connector has three-axis, coaxial, and banana head options

High current fixtures

High current fixtures

CindbestCBHC-200 High current fixture Maximum voltage: 500V Working temperature range: -55 ℃ to 300 ℃

Fully automatic wafer probe station

Fully automatic wafer probe station

Suitable for 4-12 inch wafer testing, it can provide different testing environment configurations such as high and low temperature, high voltage, and low leakage The device is simple to use, with

CP300 semi-automatic alignment probe station

CP300 semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.

CRX-SM Low temperature superconducting vacuum probe station

CRX-SM Low temperature superconducting vacuum probe station

Temperature range 8K-300K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing

CRX-Closed cycle low-temperature probe station

CRX-Closed cycle low-temperature probe station

Temperature range 4.5K-350K; IV/CV/Microwave/Optoelectronic Experimental Testing/Superconducting Vertical Magnetic Field Measurement/Low Temperature Testing

CS-4 small probe station

CS-4 small probe station

Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box

CL-6 middle-sized probe station

CL-6 middle-sized probe station

Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.

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Products Probe Station Two-Dimensional Materials Transfer Platform accessory RF Probe Test instrument
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