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  • Principle and Application Fields of Magnetic Field Probe Station Magnetic field probe stations are instruments used to measure the strength and direction of magnetic fields. Their principles and structural compositions are relatively complex. Below, we will delve into the principles, structural components, and application fields of magnetic field probe stations. I. Principle of Magnetic Fiel
    2024-04-07692
  • Classification and Corresponding Parameter Explanation of High-Low Temperature Probe Stations The high-low temperature probe station is a process test instrument used in the fields of information science and system science. It is mainly used to test the electrical characteristics of microstructured semiconductor devices, microelectronic devices, and materials under different environments and te
    2024-04-033992
  • Characteristics and Applications of Waveguide Probes The waveguide probe is a device used for transmitting and receiving microwave signals, and its characteristics and applications are as follows: Characteristics: Directionality: The waveguide probe exhibits strong directionality, enabling the transmission of microwave signals from the waveguide to free space and vice versa. High gain:
    2024-04-01693
  • Classification and Application Scenarios of High-end Probe Stations High-end probe stations are critical devices for electrical performance testing of semiconductor devices, consisting mainly of mechanical structures, probe needles, electrical performance testing instruments, and control systems. Based on their operation methods, high-end probe stations can be classified into manual, semi-au
    2024-03-27739
  • What is a DC probe and its application fields? A DC probe is a testing tool used to measure DC current and voltage in a circuit. It usually consists of a probe tip and a probe body, which can contact components in the circuit to measure their DC current and voltage. The application fields of DC probes are very广泛, mainly including the following aspects: Production and testing of electronic
    2024-03-26732