Mini size, modular design, for I-V/C-V, PIV test, optoelectronic test, up to 6 inch wafer,
applicable to glove box
CM-4 | 4" mini probe station for basic I-V/C-V test
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Features / Application
◆ For I-V/C-V, PIV test, optoelectronic test.
◆ Up to 6 inch wafer；
◆ Precise screw drive structure, linear movement；
◆ Modular design, light weight. |
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Specifications
Chuck stage
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Chuck size |
4"/ 6" |
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Rotation range |
360° with angle locking , 0.1 μm resolution fine-tuning |
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X-Y travel range |
2"*3" |
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X-Y travel resolution |
10μm/2μm/0.7μm/0.5μm upon request |
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Sample mounting type |
Vacuum |
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Stage capacity |
Up to 6 micropositioners |
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Dimension |
400mm(L)*380mm(W)*500mm(H） |
Optial system
Stereo microscope
16~200X
Travel range
360° horizontal rotation, vertical to 50.8mm
Illumination
Coaxial and ring light
CCD camera
HDMI interface, built-in XcamView
Micropositioner
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Leakage current |
10pA /100fA |
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Cable adaptor |
BNC/Banana head /Crocodile clip /Coaxial /Triaxial |
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Probe tip diameter |
0.5μm/1μm/2μm/5μm/10μm/20μm upon request |
Specifications and designs are subject to change without notice.
All Rights Reserved
Shenzhen Cindbest Technology Co., Ltd
Shenzhen Cindbest Technology Co., Ltd
Add: 8F Weihuada Industrial Park No.5 Lirong Rd Xinshi Com Dalang St Longhua Dist Shenzhen,China
Tel: 0755-29412885
E-mail: aldrich@cindbest.com;
