CH-8-D

       CINDBEST CH-8-D 双面点针探针台可用于晶圆和PCB板测试，用于需要正面和背面同时扎针，以实现各种光/电性能测试需求的测试设备。该定制探针台具有优良的机械系统，稳定的结构，符合人体工程学，以及多项升级功能。可广泛应用于集成电路、Wafer ， LED、LCD、太阳能电池等行业的制造和研究领域。

CH-8 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer. Quick and fine-tuning lift function for chuck stage. Capable for Wafer test, PCB/IC test, RF test, high voltage and current tes

CH-12 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PCB/IC test,

CT-6 non-vacuum high and low temperature probe station

Sealed chamber, optimized design with low liquid nitrogen consumption. No frost, high precise screw drive structure, linear movement.

CGO-Variable temperature vacuum probe station

High vacuum chamber, 77K-673K(liquid nitrogen)/4.5K-673K(liquid helium) temperature range, Compatible with IV/CV/RF test, radiation isolating design.

CP200 semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.

Low temperature ceramic probe

• Standard ceramic probe • Probe tip angle 120 ° • Used for high and low temperature testing

EasyZoom Super Depth Digital Microscope

Thanks to its independently developed advanced optical system, the Motic EasyZoom series ultra depth digital microscope can easily capture high-quality images Quantitative image. Powerful multifunct

0.5μm micropositioner

0.5μm resolution, Swiss made precise screw, effective and precise for I-V/C-V /RF submicron probing test, highly rigid structure, spring loaded X-Y-Z, stable and backlash free

0.7μm micropositioner

0.7μm resolution, Swiss made precise screw, effective and precise for I-V/C-V /RF submicron probing test, highly rigid structure, spring loaded X-Y-Z, stable and backlash free